Tech Xplore on MSN

Detecting 'hidden defects' that degrade semiconductor performance with 1,000X higher sensitivity

Semiconductors are used in devices such as memory chips and solar cells, and within them may exist invisible defects that ...
Semiconductor Engineering

Domain Adaptation for Image Classification of Defects in Semiconductor Manufacturing (Infineon, U. Padova et al.)

A new technical paper titled “Domain Adaptation for Image Classification of Defects in Semiconductor Manufacturing” was published by researchers at Infineon Technologies, University of Padova and ...
AlphaGalileo

KAIST detects ‘hidden defects’ that degrade semiconductor performance with 1,000× higher sensitivity

Semiconductors are used in devices such as memory chips and solar cells, and within them may exist invisible defects that ...